Fringe patterns can be formed coherently using various interferometers and incoherently using the moirâe technique. They can also be designed in fringe projection profilometry. All of these techniques are useful for full-field, noncontact, and high-sensitivity measurement. The primary goal of fringe pattern analysis is to extract the hidden phase distributions that generally relate to the physical quantities being measured. This book addresses the challenges and solutions involved in this process. Both theoretical analysis and algorithm development will be covered to facilitate the work of both researchers and engineers. The information herein may also serve as a specialized subject for students of optical and/or computer engineering
Preface -- Glossary of terms and acronyms -- 1. Introduction -- 2. Windowed Fourier ridges for exponential phase fields -- 3. Windowed Fourier filtering for exponential phase fields -- 4. Quality-guided phase unwrapping and refinement -- 5. Carrier fringe pattern demodulation -- 6. Denoising a single closed fringe pattern -- 7. Demodulating a single closed fringe pattern -- 8. Extracting dynamic phase from a sequence of fringe patterns -- 9. Algorithm acceleration using parallel computing
Windowed fringe pattern analysis
SPIE Press monograph ; PM239
2013
1 online resource (284 pages)
illustrations
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Book
Electronic Resource
English
Automatic holographic fringe pattern analysis
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