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    Title :

    Test input generation of bitwise operation based on four-valued logic


    Contributors:
    Li, Feng (author) / Wang, Yawen (author) / Gong, Yunzhan (author)


    Publication date :

    2018-01-01


    Size :

    8 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    004.05



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