Lifetime prediction based on Gamma processes from accelerated degradation data
Chinese journal of aeronautics ; 28 , 1 ; 172-179
2015-01-01
8 pages
Article (Journal)
English
DDC: | 629.13005 |
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Accelerated lifetime testing of automotive electronics
Tema Archive | 2009
|Accelerated degradation modeling method based on Inverse Gaussian processes with random parameters
British Library Online Contents | 2016
|Assessing step-down stress accelerated degradation data via nonlinear accelerated model
British Library Online Contents | 2011
|