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    Title :

    Non-destructive measurements on recrystallization and grain-size characterization of polycrystalline silicon


    Contributors:
    Kuo, C. C. (author)


    Publication date :

    2011-01-01


    Size :

    9 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.3827