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    Title :

    An eigenvalue-based similarity measure and its application in defect detection


    Contributors:
    Tsai, D. M. (author) / Yang, R. H. (author)

    Published in:

    IMAGE AND VISION COMPUTING ; 23 , 12 ; 1094-1101


    Publication date :

    2005-01-01


    Size :

    8 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.367



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