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    Title :

    THIN-FILM METROLOGY: Reflection, transmission spectrophotometry characterizes OLED materials


    Contributors:

    Published in:

    LASER FOCUS WORLD ; 41 , 8 ; 108-110


    Publication date :

    2005-01-01


    Size :

    3 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.366



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