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    Title :

    Artificial Neural Network Applied to Eddy Current Nondestructive Testing


    Contributors:
    Xiaoyun, S. (author) / Bin, Y. (author) / Jianni, S. (author)

    Published in:

    Publication date :

    2000-01-01


    Size :

    5 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    Unknown


    Classification :

    DDC:    500




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