Attenuated total reflection method for measurements of optical properties of metallic films bordering anisotropic dielectrics
OPTICAL AND QUANTUM ELECTRONICS ; 28 , 4 ; 371-380
1996-01-01
10 pages
Article (Journal)
English
DDC: | 537.5 |
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Conference Proceedings | 2003
|British Library Conference Proceedings | 1997
|British Library Online Contents | 2018
|