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    Title :

    The Uncertainty of Estimated Lognormal and Weibull Parameters for Test Data with Small Sample Size



    Conference:

    SAE 2013 world congress and exhibition ; 2013 ; Detroit, MI



    Publication date :

    2013-01-01


    Size :

    945 pages


    Remarks:

    Papers 2013-01-0150 to 2013-01-1779 held with gaps



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English


    Keywords :



    Distribution Losses for Weibull and Lognormal Clutter Types

    Thompson, R. M. / IEEE / AIAA | British Library Conference Proceedings | 2000



    Life Test Sample Size Selection Under a Weibull Failure Model

    McCool, J. I. / SAE | British Library Conference Proceedings | 1999


    Life test sample size selection under a Weibull failure model

    McCool,J.I. / Penn State Great Valley,US | Automotive engineering | 1999