Photogrammetric Recession Measurement of Ablative Materials During Arc-Jet Testing AIAA Paper
45th, AIAA aerospace sciences meeting ; 2007 ; Reno, NV
2007-01-01
2007-1158-2007-1337
Papers in the range 2007 17 to 1467 with gaps. Held on CD-ROM
Conference paper
English
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Conference Proceedings | 2016
|