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    Title :

    Design Process Error-Proofing: Benchmarking the NASA Development Life-Cycle


    Contributors:
    Chao, L. P. (author) / Tumer, I. (author) / Ishii, K. (author) / IEEE

    Conference:

    IEEE aerospace conference ; 2005 ; Big Sky, MT



    Publication date :

    2005-01-01


    Size :

    12 pages


    Remarks:

    IEEE cat no 05TH8788




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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