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    Title :

    Material Simulation-Based Electronic Device Prognosis


    Contributors:
    Nasser, L. (author) / Tryon, R. (author) / Dey, A. (author) / IEEE

    Conference:

    IEEE aerospace conference ; 2005 ; Big Sky, MT



    Publication date :

    2005-01-01


    Size :

    6 pages


    Remarks:

    IEEE cat no 05TH8788




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English





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