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    Title :

    Edi-Based Deinterlacing using Edge Patterns


    Contributors:
    Byun, M. (author) / Park, M. K. (author) / Kang, M. G. (author)

    Conference:

    International conference, Image processing; ICIP ; 2005 ; Genova, Italy



    Publication date :

    2005-01-01


    Size :

    4 pages


    Remarks:

    IEEE cat. no. 05CH37687



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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