Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Evaluation and Strain Measurement of Solar Cells By Using Digital Speckle Pattern Shearography


    Contributors:

    Conference:

    International conference; 2ND, Advanced optoelectronics and lasers:; CAOL 2005 ; 2005 ; Yalta, Ukraine



    Publication date :

    2005-01-01


    Size :

    3 pages


    Remarks:

    IEEE cat no: 05TH8809



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English





    Combined shearography and speckle pattern photography for single-access multi-component surface strain measurement [5058-44]

    Groves, R. M. / Fu, S. / James, S. W. et al. | British Library Conference Proceedings | 2003



    Digital shearography for strain measurement: an analysis of measuring errors [3479-07]

    Steinchen, W. / Yang, L. / Maeckel, G. et al. | British Library Conference Proceedings | 1998


    Measurement of residual stress in materials using digital shearography

    Hung,Y.Y. / Long,K.W. / Wang,J.Q. et al. | Automotive engineering | 1996