Thermal measurement and analysis of micro devices using thermography [5058-64]
Conference, Optical technology and image processing for fluids and solids diagnostics ; 2002 ; Beijing
2003-01-01
9 pages
Conference paper
English
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Micro-deformation measurement using focused ion-beam moire method [5058-51]
British Library Conference Proceedings | 2003
|DataCite | 1942
Warpage measurement system with systematic error analysis [5058-85]
British Library Conference Proceedings | 2003
|Study of dynamic displacement field measurement using DSPI [5058-36]
British Library Conference Proceedings | 2003
|Laser moire deflectometry applicable for mini/micro-scale flow visualization [5058-41]
British Library Conference Proceedings | 2003
|