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    Title :

    Overview of SIM external calibration [4852-09]



    Conference:

    Conference, Interferometry in space ; 2002 ; Waikoloa, HI



    Publication date :

    2003-01-01


    Size :

    11 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Nr. 4852

    DataCite | 1938


    External metrology truss technology demonstration (KITE) [4852-08]

    Nemati, B. / SPIE | British Library Conference Proceedings | 2003


    Micro-arcsecond metrology (MAM) testbed overview [4852-04]

    Hines, B. E. / Bell, C. E. / Goullioud, R. et al. | British Library Conference Proceedings | 2003


    SIM external metrology beam launcher (QP) development [4852-55]

    Ames, L. L. / Barrett, R. / Bell, R. M. et al. | British Library Conference Proceedings | 2003


    Space Interferometry Mission: flight system and configuration overview [4852-03]

    Kahn, P. / Aaron, K. M. / SPIE | British Library Conference Proceedings | 2003