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    Title :

    Defect Identification With Model-Based Test Automation



    Conference:

    Session, Testing and instrumentation 2003 ; 2003 ; Detroit, MI



    Publication date :

    2003-01-01


    Size :

    8 pages


    Remarks:

    Paper nos 2003-01-1024 to 2003-01-1037 with gaps. Held during the SAE 2003 World Congress



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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