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    Title :

    Feature Analysis Using Millimeter-Wave Real Beam and Doppler Beam Sharpening Techniques



    Conference:

    Symposium; 5th, Image analysis and interpretation ; 2002 ; Santa Fe, NM



    Publication date :

    2002-01-01


    Size :

    5 pages


    Remarks:

    Also known as SSIAI 2002. IEEE order no. PR01537



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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