Application of a Microelectronic Thermal Imaging System to Measurement of Thermal Radiation from a Launch Vehicle Nozzle
19th, Aerospace testing seminar ; 2000 ; Manhattan Beach, CA
2000-01-01
7 pages
Theme title: Balancing the forces of "faster, better, cheaper"; See also 4759.425 vol 43 no 3 2000 for abstracts
Conference paper
English
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