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    Title :

    Structural perfection diagnostics of narrow-gap photosensitive semiconductor junctions by electron diffraction [4340-37]



    Conference:

    International conference; 16th, Photoelectronics and night-vision devices ; 2000 ; Moscow



    Publication date :

    2000-01-01


    Size :

    3 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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    Nr. 4340

    DataCite | 1928


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    Metastable behavior of current-voltage characteristics in Hg~1~-~xCd~xTe p-n junctions [4340-14]

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