Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Comparison of nondestructive and noninvasive material depth profiling using FT-Raman fiber optics and microspectroscopy [4129-32]



    Conference:

    Conference; 2nd, Subsurface sensing technologies and applications ; 2000 ; San Diego, CA



    Publication date :

    2000-01-01


    Size :

    10 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Nondestructive detection of defects in materials using microwaves [4129-03]

    Glay, D. / Lasri, T. / Mamouni, A. et al. | British Library Conference Proceedings | 2000


    Nr. 4129

    DataCite | 1924


    Confocal Raman microscopy for the depth profiling of polymer/polymer and polymer/glass interfaces (Invited Paper) [4129-30]

    Sammon, C. / Eaton, P. / Mura, C. et al. | British Library Conference Proceedings | 2000


    Multifrequency EM image system [4129-40]

    Zhang, Q. / Chen, X. / Jiang, X. et al. | British Library Conference Proceedings | 2000


    Near-subsurface moisture sensing [4129-10]

    Hubner, C. / Brandelik, A. / International Society for Optical Engineering | British Library Conference Proceedings | 2000