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    Title :

    Transverse modal characterization of VCSELs based on intensity measurement [3952-17]



    Conference:

    Conference; 2nd, Photonics packaging and integration ; 2000 ; San Jose, CA



    Publication date :

    2000-01-01


    Size :

    12 pages


    Remarks:

    Held in conjunction with the 7th conference on optoelectronic interconnects




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Transverse modal characterization of VCSELs based on intensity measurement [3952-17]

    Xue, X. / Kirk, A. G. / SPIE | British Library Conference Proceedings | 2000


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