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    Title :

    2000-01-0054 Error Analysis of Curvature-Based Contour Measurement Devices


    Contributors:
    Bass, C. R. (author) / Wang, C. (author) / Crandall, J. (author) / SAE

    Conference:

    Session, Safety test methodologies ; 2000 ; Detroit, MI



    Publication date :

    2000-01-01


    Size :

    18 pages


    Remarks:

    Papers in the range 2000-01-0047 to 0610, with gaps. Held as part of the SAE 2000 World Congress



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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