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    Title :

    Impurity profile determination by the optimal parameter choice method [3890-44]



    Conference:

    International conference; 4th, Material science and material properties for infrared optoelectronics ; 1998 ; Kiev



    Publication date :

    1999-01-01


    Size :

    5 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Nr. 3890

    DataCite | 1920


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    Charge impurity states of In, Ga, Ge in narrow-gap PbTe [3890-26]

    Zlomanov, V. P. / Tkalich, A. K. / National Academy of Sciences of Ukraine; Institute of Semiconductor Physics | British Library Conference Proceedings | 1999


    New pyroactive structures for infrared optoelectronics [3890-09]

    Blonskiy, I. V. / Kosorotov, V. F. / Shchedrina, L. V. et al. | British Library Conference Proceedings | 1999


    Superluminal transfer of information in electrodynamics [3890-50]

    Oleinik, V. P. / National Academy of Sciences of Ukraine; Institute of Semiconductor Physics | British Library Conference Proceedings | 1999