Imaging-eclipsing-Z-scan method for measurement of the nonlinear refractive index of materials [3572-39]
3rd, Iberoamerican optics meeting ; 1998 ; Cartagena de Indias; Colombia
1999-01-01
6 pages
Also known as III RIAO - OPTILAS'98
Conference paper
English
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Nonlinear optical properties of organic materials [3572-03]
British Library Conference Proceedings | 1999
|Total profile distortion Z-scan (Invited Paper) [3572-36]
British Library Conference Proceedings | 1999
|DataCite | 1914
Tapered optical fiber devices [3572-25]
British Library Conference Proceedings | 1999
|High-aperture Gaussian beams [3572-09]
British Library Conference Proceedings | 1999
|