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    Title :

    Modeling of synchrotron reflectance calibrations of AXAF iridium-coated witness mirrors over 2 to 12 keV [3444-11]



    Conference:

    Meeting, X-ray optics, instruments, and missions ; 1998 ; San Diego; CA



    Publication date :

    1998-01-01


    Size :

    20 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Development of beamline U3A for AXAF synchrotron reflectivity calibrations [3444-60]

    Burek, A. J. / Cobuzzi, J. C. / Fitch, J. J. et al. | British Library Conference Proceedings | 1998


    Use of monochromators during AXAF calibration [3444-14]

    Swartz, D. A. / Elsner, R. F. / Kolodziejczak, J. J. et al. | British Library Conference Proceedings | 1998


    AXAF grating efficiency measurements with calibrated nonimaging detectors [3444-05]

    Dewey, D. / Drake, J. J. / Edgar, R. J. et al. | British Library Conference Proceedings | 1998


    Analysis and modeling of anomalous scattering in the AXAF HETGS [3444-07]

    Davis, J. E. / Marshall, H. L. / Dewey, D. et al. | British Library Conference Proceedings | 1998


    Calibration results for the AXAF flight contamination monitor [3444-13]

    Elsner, R. F. / O'Dell, S. L. / Ramsey, B. D. et al. | British Library Conference Proceedings | 1998