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    Title :

    Pattern recognition of industrial defects by multiresolution analysis with wavelet decomposition [3458-23]



    Conference:

    Conference; 6th, Wavelet applications in signal and image processing ; 1998 ; San Diego; CA



    Publication date :

    1998-01-01


    Size :

    12 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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    Lin, S.-F. / Rohde, G. / Aldroubi, A. et al. | British Library Conference Proceedings | 1998


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    Decomposition and compression of Kirchhoff migration operator by adapted wavelet packet transform [3458-30]

    Wang, Y. / Wu, R.-S. / SPIE | British Library Conference Proceedings | 1998