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    Title :

    Impact of excess low-frequency noise (ELFN) in Si:As impurity band conduction (IBC) focal plane arrays for astronomical applications [3379-38]



    Conference:

    Conference; 5th, Infrared detectors and focal plane arrays ; 1998 ; Orlando; FL



    Publication date :

    1998-01-01


    Size :

    10 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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