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    Title :

    Precise measurement of nonoptical surfaces by an oblique incidence interferometer [3478-20]



    Conference:

    Conference; 9th, Laser interferometry: applications ; 1998 ; San Diego; CA



    Publication date :

    1998-01-01


    Size :

    4 pages



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Nr. 3478

    DataCite | 1912


    Direct group-delay measurement and 3D profilometry using a white-light interferometer [3478-06]

    Liang, Y. / Wu, Q. M. J. / Grover, C. P. et al. | British Library Conference Proceedings | 1998



    Flatness measurement by a UV moire technique [3478-54]

    Fujiwara, H. / Kodera, Y. / Otani, Y. et al. | British Library Conference Proceedings | 1998


    Fourier transform moire deflectometry [3478-42]

    Wang, M. / Li, D. / Zhong, J. et al. | British Library Conference Proceedings | 1998