Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Direct group-delay measurement and 3D profilometry using a white-light interferometer [3478-06]



    Conference:

    Conference; 9th, Laser interferometry: applications ; 1998 ; San Diego; CA



    Publication date :

    1998-01-01


    Size :

    12 pages



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Nr. 3478

    DataCite | 1912


    Precise measurement of nonoptical surfaces by an oblique incidence interferometer [3478-20]

    Otani, Y. / Kuwahara, T. / Yamamoto, M. et al. | British Library Conference Proceedings | 1998


    New error-compensating seven-sample phase-shifting algorithm and application in 3D fringe projection profilometry [3478-11]

    Zhang, H. / Lalor, M. J. / Burton, D. R. et al. | British Library Conference Proceedings | 1998



    Single phase-step algorithm for phase difference measurement using ESPI [3478-14]

    Sesselmann, M. / Albertazzi Goncalves, A. / SPIE | British Library Conference Proceedings | 1998