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    Title :

    Wide-scale surface measurement using white light interferometry and atomic force microscopy [3479-04]


    Contributors:

    Type of media :

    Conference paper


    Type of material :

    Print



    Surface topography by wavelength scanning interferometry [3479-03]

    Yamaguchi, I. / Yamamoto, A. / Yano, M. et al. | British Library Conference Proceedings | 1998


    Autoanalysis system for stroboscopic holographic interferometry [3479-29]

    Wang, X. / Kang, M. / SPIE | British Library Conference Proceedings | 1998


    Subnanometer laser metrology for spacecraft interferometry [3479-08]

    Leitch, J. W. / Kopp, G. A. / Noecker, C. et al. | British Library Conference Proceedings | 1998


    Dual-hologram shearing interferometry with regulated sensitivity [3479-28]

    Toker, G. R. / Levin, D. / SPIE | British Library Conference Proceedings | 1998


    Extension of electronic speckle correlation interferometry to large deformations [3479-30]

    Sciammarella, C. A. / Sciammarella, F. M. / SPIE | British Library Conference Proceedings | 1998