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    Title :

    Reliability of 680-nm Window Laser Diodes at 50-100mW CW Operation



    Conference:

    International conference; 15th, Semiconductor laser ; 1996 ; Haifa; Israel



    Publication date :

    1996-01-01


    Size :

    2 pages


    Remarks:

    Also known as ISLC '96. IEEE cat no 96CH35896 and 96CB35896



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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