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    Title :

    Surface profile determination by additive-subtractive phase-modulated ESPI with Fourier analysis [2860-19]



    Conference:

    Conference; 8th, Laser interferometry VIII: techniques and analysis ; 1996 ; Denver; CO



    Publication date :

    1996-01-01


    Size :

    13 pages


    Remarks:

    See also same shelfmark vol 2861 1996 for further papers




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English





    Nr. 2860

    DataCite | 1900


    Fourier transform technique for phase unwrapping with minimized boundary effects [2860-06]

    Rivera, M. / Servin, M. / Marroquin, J. L. et al. | British Library Conference Proceedings | 1996


    Achromatic phase shifting for polarization interferometry [2860-11]

    Hariharan, P. / Roy, M. / SPIE | British Library Conference Proceedings | 1996


    Precise surface measurement by local sampling phase-shifting technique [2860-14]

    Otani, Y. / Mori, H. / Yoshizawa, T. et al. | British Library Conference Proceedings | 1996