Actively phase-compensated portable fiber optic electronic speckle pattern interferometer (ESPI) for long-term in-situ measurements [2860-17]
Conference; 8th, Laser interferometry VIII: techniques and analysis ; 1996 ; Denver; CO
1996-01-01
6 pages
See also same shelfmark vol 2861 1996 for further papers
Conference paper
English
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Modified in-plane electronic speckle pattern shearing interferometry (ESPSI) [2860-28]
British Library Conference Proceedings | 1996
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|Investigation of speckle displacement effects on speckle interferometry [2860-47]
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British Library Conference Proceedings | 1996
|Double shear speckle interferometry for curvature measurement [2860-21]
British Library Conference Proceedings | 1996
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