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    Title :

    Rapid Measurement of Residual Stress by Computerized Shearography


    Contributors:
    Hung, Y. Y. (author) / Long, K. W. (author) / Wang, J. Q. (author) / Zhang, X. (author) / SAE

    Conference:

    Session; International congress, Testing and instrumentation ; 1996 ; Detroit; MI



    Size :

    7 pages



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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