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    Title :

    Etched bonded silicon wafers as test objects for the resolution power of subsurface voids [2643-40]



    Conference:

    6th International spring school, Acousto-optics and applications II ; 1995 ; Jurata; Poland



    Publication date :

    1995-01-01


    Size :

    7 pages


    Remarks:

    May be asked for as being held in Gdansk




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Nr. 2643

    DataCite | 1896


    Mathematical processing of Mandelstam-Brillouin spectra [2643-16]

    Stanev, G. P. / University of Gdansk / Institute of Experimental Physics| SPIE et al. | British Library Conference Proceedings | 1995


    Intensity fiber optic temperature sensors [2643-38]

    Pustelny, T. / University of Gdansk / Institute of Experimental Physics| SPIE et al. | British Library Conference Proceedings | 1995


    Photothermal measurements for plates [2643-34]

    Bodzenta, J. / Mazur, J. / Bukowski, R. et al. | British Library Conference Proceedings | 1995


    Integrated optical amplitude refractometer [2643-19]

    Karasinski, P. / Opilski, A. / Gut, K. et al. | British Library Conference Proceedings | 1995