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    Title :

    Microdiffraction measurements of the effects of grain alignment on critical current in high-temperature superconductors (Invited Paper) [2516-21]


    Contributors:

    Conference:

    Conference, X-ray microbeam technology and applcations ; 1995 ; San Diego; CA



    Publication date :

    1995-01-01


    Size :

    10 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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