New Method for the Measurement of the Mirror's Temperature of a Semiconductor Laser Diode Based on Mirage Effect
3rd Biennial divisional conference, Applied optics and optoelectronics ; 1994 ; York
1994-01-01
3 pages
Held jointly with the annual meeting and conference of the European Optical Society (EOSAM '94) and the biennial meeting of the Optical Group of the Institute of Physics (Optics '94)
Conference paper
English
EOSAM , applied optics , optoelectronics , EOS , optics , physics
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