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    Title :

    Luminescence diagnostics of direct-gap semiconductors within a wide range of excitation levels [2113-16]



    Conference:

    International workshop, Optical diagnostics of materials and devices for opto-, micro-, and quantum electronics ; 1993 ; Kiev



    Publication date :

    1994-01-01


    Size :

    4 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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    Tarasov, G. G. / Mazur, Y. I. / Tomm, J. W. et al. | British Library Conference Proceedings | 1994


    Intracavity diagnostics of optical inhomogeneity [2113-21]

    Bekshaev, A. Y. / Grimblatov, V. M. / SPIE | British Library Conference Proceedings | 1994


    Express method for optical strength diagnostics in transparent dielectrics and semiconductors [2113-26]

    Korsunskaya, N. E. / Kulish, N. R. / Pekar, G. S. et al. | British Library Conference Proceedings | 1994


    Nr. 2113

    DataCite | 1886


    ZnSe quality analysis by x-ray luminescence [2113-17]

    Artamonova, A. A. / Degoda, V. Y. / Rodionov, V. E. et al. | British Library Conference Proceedings | 1994