Feature Extraction and Feature Selection of Microwave Scattering Images
National aerospace and electronics conference ; 1994 ; Dayton; OH
1994-01-01
5 pages
In 2 vols; Theme title: Technology for a global market. Also known as NAECON 1994. IEEE Cat no 94CH3431-4; See also 4362.78768 vol 9 no 9 1994 for selected reports
Conference paper
English
aerospace , electronics , NAECON , IEEE , AESS
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