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    Title :

    EZ-scan: single-beam measurement technique for thin-film nonlinearities [2229-17]


    Contributors:

    Conference:

    Conference, Nonlinear optical materials for switching and limiting ; 1994 ; Orlando; FL



    Publication date :

    1994-01-01


    Size :

    10 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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