Z-scan measurement on liquid crystals using top-hat beams [2229-16]
Conference, Nonlinear optical materials for switching and limiting ; 1994 ; Orlando; FL
1994-01-01
17 pages
Conference paper
English
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
EZ-scan: single-beam measurement technique for thin-film nonlinearities [2229-17]
British Library Conference Proceedings | 1994
|NTRS | 1993
|NTIS | 1993
|Tandem limiter optimization [2229-20]
British Library Conference Proceedings | 1994
|CdS microcrystalline-doped phosphorous glasses [2229-02]
British Library Conference Proceedings | 1994
|