Synonyme wurden verwendet für:
integrated circuit testing
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keywords:("integrated circuit testing")
Technologies and reliability of modern embedded flash cells
Low LET cross-section measurements using high energy carbon beam (DRAMs/SRAMs)
In situ screening techniques for defective oxides in devices for automotive applications
Single event gate rupture in thin gate oxides
FPGA-based advanced digital signal inspector for internal signals of pin-limited systems-on-package
Evaluation of STMicroelectronics RH-L4913 positive hardened low drop voltage regulator
An alternative solution to TPS re-host
Model-based testing of real-time embedded systems in the automotive domain
New on-chip screening of gate oxides smart power devices for automotive applications
An application of analogue BIST to an automotive circuit
Single event latchup threshold estimation based on laser dose rate test results
Heavy-ion single-event effects testing of lead-on-chip assembled high-density memories
Diagnosis from within the system (built-in test)
Impact of aging on radiation hardness(CMOS SRAMs)
Qualification of plastic encapsulated microcircuits (PEM) for avionics
ICAs for automotive applications in higher temperature ranges
Reliable power electronics for automotive applications
Automated synthesis of SEU tolerant architectures from OO descriptions