1–20 von 30 Ergebnissen
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    Ultra high reliable spacecraft computer system design considerations

    Rayapati, V.N. / Mukedkhar, D. | Tema Archiv | 1992

    Timing analysis of expedient voting and runahead

    Krishna, C.M. | Tema Archiv | 1994

    Availability assessment methods and their application in practice

    Dekker, R. / Groenendijk, W. | Tema Archiv | 1995

    Application of expert systems to systems reliability evaluation

    Rawicz, A.H. / Girling, D. | Tema Archiv | 1995

    Reliability analysis of an automotive transmission system

    Kumar, P. / Gaindhar, J.L. | Tema Archiv | 1996

    A reliability study of a small vehicle

    Reiche, H. | Tema Archiv | 1997

    On-chip reliability investigations on power modules actually working in inverter systems

    Franke, T. / Honsberg-Riedl, M. / Simon, P. et al. | Tema Archiv | 1998

    A case study of IC storage failures in Taipei trains

    Zhang, Y. / Pecht, M. / Lantz, L. | Tema Archiv | 1998

    Strain depending reliability of automotive diodes

    Galateanu, L. / Stoica, M.G. / Popa, E. | Tema Archiv | 1998

    Ball grid array reliability assessment for aerospace applications

    Ghaffarian, R. / Kim, N.P. | Tema Archiv | 1999

    Long term reliability testing of HV-IGBT modules in worst case traction operation

    Fratelli, L. / Cascone, B. / Giannini, G. et al. | Tema Archiv | 1999

    An assessment of the value of added screening of electronic components for commercial aerospace applications

    Hester, K.D. / Koehler, M.P. / Kanciak-Chwialkowski, H. et al. | Tema Archiv | 2001

    Reliability of MEMS - a methodical approach

    Muller-Fiedler, R. / Wagner, U. / Bernhard, W. | Tema Archiv | 2002

    Reliable power electronics for automotive applications

    Seliger, N. / Wolfgang, E. / Lefranc, G. et al. | Tema Archiv | 2002

    High temperature reliability testing of aluminum and tantalum electrolytic capacitors

    Dehbi, A. / Wondrak, W. / Ousten, Y. et al. | Tema Archiv | 2002

    Reliability aspects of semiconductor devices in high temperature applications

    Kanert, W. / Dettmer, H. / Plikat, B. et al. | Tema Archiv | 2003

    Semiconductors in high temperature applications - a future trend in automotive industry

    Goroll, M. / Pufall, R. / Kanert, W. et al. | Tema Archiv | 2004