1–20 von 75 Ergebnissen
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    InGaN nanowires on silicon

    Weiszer, Saskia Maria Edda / Verein zur Förderung des Walter Schottky Instituts der Technischen Universität München | TIBKAT | 2019
    Schlagwörter: Durchstrahlungselektronenmikroskopie

    Growth and Characterization of Silicon on Glass and Reorganized Porous Silicon Substrates for Photovoltaic Applications

    Ehlers, Bernard Christian | TIBKAT | 2020
    Schlagwörter: Durchstrahlungselektronenmikroskopie

    Mikroskopische Analyse und elektrochemische Charakterisierung von sputter-deponierten V2O5- und LiCoO2-Dünnschichtelektroden

    Gallasch, Tobias | TIBKAT | 2014
    Schlagwörter: Durchstrahlungselektronenmikroskopie

    Synthesis and Nox Gas Sensing Properties of In1.82 ni0.18 o3 Electrospun Nanofibers

    Wang, Jinxing / Zhang, Kejin / Wang, Dan et al. | Tema Archiv | 2012
    Schlagwörter: hochauflösende Transmissionselektronenmikroskopie , Transmissionselektronenmikroskopie

    The effect of partial replacement of carbon black by carbon nanotubes on the properties of natural rubber/butadiene rubber compound

    Poikelispää, Minna / Das, Amit / Dierkes, Wilma et al. | Tema Archiv | 2013
    Schlagwörter: Transmissionselektronenmikroskopie

    Pt rate at MOF-177: synthesis, room-temperature hydrogen storage and oxidation catalysis

    Proch, Sebastian / Herrmannsdörfer, Justus / Kempe, Rhett et al. | Tema Archiv | 2008
    Schlagwörter: TEM (Transmissionselektronenmikroskopie)

    Properties of the weld metal of two-sided welded joints on pipes made from increased-strength microalloyed steels

    Rybakov, A.A. / Semyonov, S.E. / Filipchuk, T.N. | Tema Archiv | 2013
    Schlagwörter: Transmissionselektronenmikroskopie

    A sol-gel based magneto-optical device for the NANOSAT space mission

    Zayat, M. / Pardo, R. / Rosa, G. et al. | Tema Archiv | 2009
    Schlagwörter: Transmissionselektronenmikroskopie

    Development of modified solution SBR for the reduction of rolling resistance of tire

    Kawai, Takahiro | Tema Archiv | 2012
    Schlagwörter: TEM (Transmissionselektronenmikroskopie)

    Study of microstructure and cementite in automobile beam steels produced by compact strip production with flexible technologies

    Yu, Hao / Kang, Yonglin / Zhao, Zhengzhi et al. | Tema Archiv | 2005
    Schlagwörter: Transmissionselektronenmikroskopie

    Microstructure of the worn surfaces of a bainitic steel railway crossing

    Zhang, F.C. / Lv, B. / Zheng, C.L. et al. | Tema Archiv | 2010
    Schlagwörter: TEM (Transmissionselektronenmikroskopie)

    Crystal orientation analysis of serviced rail with rolling contact fatigue damage

    Satoh, Y. / Iwafuchi, K. | Tema Archiv | 2003
    Schlagwörter: TEM (Transmissionselektronenmikroskopie)

    Microstructure and mechanical properties of a kind of Nb-V micro-alloyed forging steel

    Zhao, Yang / Chen, Li-qing / Xu, Xiang-qiu et al. | Tema Archiv | 2009
    Schlagwörter: Transmissionselektronenmikroskopie

    Effect of bonding temperature on the precipitation of delta phase in diffusion bonded Inconel 718 joints

    Zhang, Guoge / Chandel, Roop Singh / Pheow, Seow Hong et al. | Tema Archiv | 2006
    Schlagwörter: TEM (Transmissionselektronenmikroskop)

    Nb-base FS-85 alloy as a candidate structural material for space reactor applications: Effects of thermal aging

    Leonhard, Keith J. / Busby, Jeremy T. / Hoelzer, David T. et al. | Tema Archiv | 2009
    Schlagwörter: Transmissionselektronenmikroskopie

    Stability of the microstructure and microhardness of a cast TiAl-based intermetallic alloy for turbine blades

    Lapin, J. / Pelachova, T. | Tema Archiv | 2004
    Schlagwörter: Transmissionselektronenmikroskopie

    gamma '/gamma '' interfacial chemistry in an Inconel 718 alloy after service

    Ping, D.H. / Gu, Y.F. / Cui, C.Y. et al. | Tema Archiv | 2006
    Schlagwörter: Transmissionselektronenmikroskopie

    Microscopy study of intergranular stress corrosion cracking of X-52 line pipe steel

    Elboujdaini, M. / Li, J. / Fang, B. et al. | Tema Archiv | 2006
    Schlagwörter: Transmissionselektronenmikroskopie