Synonyme wurden verwendet für: metrology
Suche ohne Synonyme: keywords:(optical metrology)

81–100 von 114 Ergebnissen
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    Nondestructive film thickness measurement using atomic force microscopy at ultrasonic frequencies [4099-06]

    Crozier, K. B. / Yaralioglu, G. G. / Degertekin, F. L. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Optical microscopy at sub-0.1-mum resolution for semiconductor applications [4099-03]

    Vollrath, W. / SPIE | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    New procedure for the optical characterization of high-quality thin films [4099-16]

    Bosch, S. / Leinfellner, N. / Quesnel, E. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Advanced methods for surface and subsurface defect characterization of optical components [4099-34]

    Steinert, J. / Gliech, S. / Wuttig, A. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Accuracy of the thin metallic wires diameter using Fraunhofer diffraction technique [4099-31]

    Serroukh, I. / Martinez-Anton, J. C. / Bernabeu, E. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Ellipsometry: a sophisticated tool for optical metrology (Invited Paper) [4099-23]

    Azzam, R. M. A. / SPIE | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Calibration tool for a CCD-camera-based vision system [4099-19]

    Xu, G. / Tan, S. L. / Low, S. P. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    DUV/VUV light scattering measurement of optical components for lithography applications [4099-10]

    Gliech, S. / Steinert, J. / Flemming, M. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    X-ray study of the roughness of surfaces and interfaces [4099-12]

    Kozhevnikov, I. V. / Asadchikov, V. E. / Bukreeva, I. N. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Variable angle spectroscopic ellipsometry in the vacuum ultraviolet (Invited Paper) [4099-24]

    Woollam, J. A. / Hilfiker, J. N. / Tiwald, T. E. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    2D-area/3D-volume holographic optical storage nanotechnology [4099-22]

    Thomas, M. E. / SPIE | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Methods, error influences, and limits for the ultraprecise measurement of slope and figure for large, slightly nonflat, or steep complex surfaces [4099-18]

    Weingartner, I. / Schulz, M. / Thomsen-Schmidt, P. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Microroughness analysis of thin film components for VUV applications [4099-13]

    Ferre-Borrull, J. / Duparre, A. / Steinert, J. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Characteristics of tantalum oxynitride films prepared by rf magnetron sputtering [4099-30]

    Jong, C. A. / Chin, T. S. / SPIE | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    New purged UV spectroscopic ellipsometer to characterize thin films and multilayers at 157 nm [4099-25]

    Boher, P. / Evrard, P. / Piel, J.-P. et al. | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Standardization in optics characterization (Invited Paper) [4099-14]

    Ristau, D. / SPIE | British Library Conference Proceedings | 2000
    Schlagwörter: optical metrology

    Optical path control in the MAM testbed

    Regehr, M. / Hines, B. / Holmes, B. | NTRS | 2003
    Schlagwörter: optical interferometers optical path MAM testbed Micro-Arcsecond Metrology

    Rules for Optical Testing

    H. P. Stahl | NTIS | 2016
    Schlagwörter: Optical measurement , Optical properties , Metrology

    Permanently updated 3D-model of actual geometries of research environments

    Freier Zugriff
    Rauscher, Fiete / Fuchs, Mara / Ghanjaoui, Yassin et al. | Springer Verlag | 2023
    Schlagwörter: Optical metrology

    Overview of Differential Deposition at NASA MSFC

    M. Gubarev | NTIS | 2016
    Schlagwörter: Metrology , Optical coatings