1–10 von 48 Ergebnissen
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    Single-event effects in avionics

    Normand, E. | Tema Archiv | 1996

    Radiation Hardness of TiO2 Memristive Junctions

    Tong, William M. / Yang, J.Joshua / Kuekes, Philip J. et al. | Tema Archiv | 2010

    Proton effects in charge-coupled devices

    Hopkinson, G.R. / Dale, C.J. / Marshall, P.W. | Tema Archiv | 1996

    Probability model for worst case solar proton event fluences

    Xapsos, M.A. / Summers, G.P. / Barth, J.L. et al. | Tema Archiv | 1999

    Optocouplers: fundamentals and hardness assurance for space applications

    Johnston, A.H. / Harris, R.D. / Miyahira, T.F. | Tema Archiv | 2009

    Single event gate rupture in thin gate oxides

    Sexton, F.W. / Fleetwood, D.M. / Shaneyfelt, M.R. et al. | Tema Archiv | 1997

    A review of the techniques used for modeling single-event effects in power MOSFET's

    Johnson, G.H. / Palau, J.M. / Dachs, C. et al. | Tema Archiv | 1996