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Halbleiterbauelement
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keywords:("Halbleiterbauelement")
Grating Coupled III-V Quantum Well Infrared Detectors for Long-Wavelength (8-14m) IR Detection
LWIR Imaging Using Miniband Transport Multiple Quantum Well Infrared Detectors
Localization of sub-100-nm particles on wafers with solid state detector arrays [5188-35]
Mueller matrix polarimeter in 157 nm [5188-18]
New magnetic semiconductor sulfospinels with cobalt [5188-47]
Reliable determination of wavelength dependence of thin film refractive index [5188-25]
At-wavelength metrology on Sc-based multilayers for the UV and water window [5188-17]
Optimization of optical coatings for the UV/VUV range (Invited Paper) [5188-11]
Low Specific Contact Resistivity GaAsSb P-Type Ohmic Contacts for AlGaAs/GaAs Based Devices
Artifically Structured Materials for Opto-electronics Devices
Mechanism of Dark Current and Photocurrent, and a Multicolor Quantum Well Infrared Photodetector
Two-Mode InGaSb/GaSb Strained-Layer Superlattice, Infrared Photodetectors
Radioactive decay of excitations in ZnSe (Te) [5188-45]
Information reconstruction based on phase-shifting technique in digital holography [5188-44]
Accuracy of optical thin film parameter determination based on spectrophotometric data [5188-24]
VUV light-scattering measurements of substrates and thin film coatings [5188-14]
Finite difference approach to optical scattering of gratings [5188-43]
Image detection system for 157 nm using fluorescent glass [5188-16]