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    Titel :

    Finite difference approach to optical scattering of gratings [5188-43]



    Kongress:

    Annual conference, Advanced characterization techniques for optics, semiconductors, and nanotechnologies



    Erscheinungsdatum :

    2003-01-01


    Format / Umfang :

    13 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    VUV light-scattering measurements of substrates and thin film coatings [5188-14]

    Hultaker, A. / Gliech, S. / Benkert, N. et al. | British Library Conference Proceedings | 2003


    New magnetic semiconductor sulfospinels with cobalt [5188-47]

    Saifullaeva, D. A. / Solieva, S. F. / International Society for Optical Engineering | British Library Conference Proceedings | 2003


    Mueller matrix polarimeter in 157 nm [5188-18]

    Jin, L. / Kowa, H. / Otani, Y. et al. | British Library Conference Proceedings | 2003


    Characterizing surface roughness of thin films by polarized light scattering (Invited Paper) [5188-33]

    Germer, T. A. / Fasolka, M. J. / International Society for Optical Engineering | British Library Conference Proceedings | 2003


    Radioactive decay of excitations in ZnSe (Te) [5188-45]

    Gordeev, S. I. / Galkin, S. N. / Kostyukevich, S. A. et al. | British Library Conference Proceedings | 2003