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X-ray study of the roughness of surfaces and interfaces [4099-12]
Variable angle spectroscopic ellipsometry in the vacuum ultraviolet (Invited Paper) [4099-24]
2D-area/3D-volume holographic optical storage nanotechnology [4099-22]
Optical microscopy at sub-0.1-mum resolution for semiconductor applications [4099-03]
New procedure for the optical characterization of high-quality thin films [4099-16]
Advanced methods for surface and subsurface defect characterization of optical components [4099-34]
Accuracy of the thin metallic wires diameter using Fraunhofer diffraction technique [4099-31]
Ellipsometry: a sophisticated tool for optical metrology (Invited Paper) [4099-23]
Calibration tool for a CCD-camera-based vision system [4099-19]
DUV/VUV light scattering measurement of optical components for lithography applications [4099-10]
Microroughness analysis of thin film components for VUV applications [4099-13]
Space manufacture now within reach of industry
Elementary processes in organic photovoltaics
Germanium, indium and gallium for German industry
1992 4TH NASA SERC Symposium on VLSI Design
VHSIC Electronics and the Cost of Air Force Avionics in the 1990s
Foreign Science Bulletin, Vol. 2, No. 11